P1581 Status and Technical update

نویسندگان

  • Frans de Jong
  • Leon van de Logt
چکیده

Since 2001 the IEEE p1581 working group aims to provide a test standard for memories that cannot have boundary scan. Currently this p1581 activity focuses on test access and test circuitry. The latter came to a resolution and will be explained. Economic advantages for the user of p1581 devices and further work will be discussed.

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تاریخ انتشار 2002